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Magical Tome

Cover of In situ real time characterization of thin films
First published
2000
Publisher
Wiley & Sons, Incorporated, John
Pages
272 pages
ISBN
9780470304075

In situ real time characterization of thin films

The outer archives are busy

by Orlando Auciello

About this book

As thin-film materials, device structures, and processing conditions become increasingly more complex, there is a growing need for in situ, real-time, surface-specific analytical tools to characterize phenomena occurring at interfaces between layered structures and at the surface of thin films during growth.

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