Back to Results
—out of 5—out of 5—out of 5—out of 5—out of 5—out of 5
Magical Tome
- First published
- 2013
- Publisher
- Springer London, Limited
- ISBN
- 9783642420245
VLSI Design and Test
The outer archives are busy
About this book
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Match Score
Create a free account to see Match Scores on books the community has marked — once you’ve set your preferences.
Create free accountMarks of the Realm
Marks left by readers of this tome
No community marks yet — be the first to inscribe this tome.
Pacing
Horror / Dark Elements
Romance
Spice Level
LGBTQ+ Representation
Social & Political Themes in Stories