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Magical Tome

Placeholder cover for Theory and experiments of electron-hole recombination at Si/SiO2 interface traps and tunneling in thin oxide MOS transistors
First published
2000
Publisher
Gainesville, FL
Pages
208 pages

Theory and experiments of electron-hole recombination at Si/SiO2 interface traps and tunneling in thin oxide MOS transistors

The outer archives are busy

by Jin Cai

About this book

http://uf.catalog.fcla.edu/uf.jsp?st=UF002640401&ix=pm&I=0&V=D&pm=1

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