Beam effects, surface topography, and depth profiling in surface analysisAlvin Warren Czanderna · First published 1998Open the Tome
Specimen handling, preparation, and treatments in surface characterizationAlvin Warren Czanderna · First published 1998Open the Tome
Polymer/inorganic interfacesRobert Leon Opila, F. J. Boerio, Alvin Warren Czanderna, R. L. Opila, F. James Boerio · First published 1993Open the Tome
Ion spectroscopies for surface analysisAlvin Warren Czanderna, David M. Hercules · First published 1991Open the Tome
Applications of piezoelectric quartz crystal microbalancesAlvin Warren Czanderna · First published 1984Open the Tome
Methods of Surface AnalysisAlvin Warren Czanderna · First published 1975 · Latest edition 1984Open the Tome
Basic research needs and opportunities on interfaces in solar materialsAlvin Warren Czanderna · First published 1981Open the Tome
Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin filmsAlvin Warren Czanderna · First published 1978Open the Tome
