Metrology and Diagnostic Techniques for NanoelectronicsZhiyong Ma, David G. Seiler · First published 2016Open the Tome
Characterization and metrology for ULSI technology, 2000David G. Seiler · First published 2000Open the Tome
Characterization and metrology for ULSI technologyDavid G. Seiler · First published 1998Open the Tome
Semiconductor characterizationW. Murray Bullis, David G. Seiler, A. C. Diebold · First published 1996Open the Tome
Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellitesDavid G. Seiler · First published 1994Open the Tome
Spectroscopy of SemiconductorsRobert K. Willardson, Eicke R. Weber, Albert C. Beer, Christopher L. Littler, David G. Seiler · First published 1992Open the Tome
