Diagnostic Techniques for Semiconductor Materials Processing II Vol. 406Orest J. Glembocki, Fred H. Pollak · First published 1996Open the Tome
Layered structuresB. W. Dodson, L. J. Schowalter, J. E. Cunningham, Fred H. Pollak · First published 1990Open the Tome
Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditionsFred H. Pollak · First published 1990Open the Tome
Surface and interface analysis of microelectronic materials processing and growthFred H. Pollak · First published 1990Open the Tome
Spectroscopic characterization techniques for semiconductor technology IIIFred H. Pollak, Fernando Ponce, Orest J. Glembocki · First published 1988Open the Tome
Modern optical characterization techniques for semiconductors and semiconductor devicesFred H. Pollak, Jin-Joo Song · First published 1987Open the Tome
Spectroscopic characterization techniques for semiconductor technology IIFred H. Pollak · First published 1985Open the Tome
Spectroscopic charcterization techniques for semiconductor technologyRobert S. Bauer, Fred H. Pollak · First published 1983Open the Tome
