Silicon, Germanium, and Their AlloysGudrun Kissinger, Sergio Pizzini · First published 2014Open the Tome
In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing IIGudrun Kissinger · First published 2001Open the Tome
In-line characterization, yield reliability, and failure analysis in microelectronics manufacturingGudrun Kissinger · First published 1999Open the Tome
