Solid state radiation dosimeters for space and medical applicationsMartin G. Buehler · First published 1996Open the Tome
Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurementsMartin G. Buehler · First published 1976Open the Tome
Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape scriptMartin G. Buehler · First published 1976Open the Tome
Microelectronic test pattern NBS-3 for evaluating the resistivity-dopant density relationship of siliconMartin G. Buehler · First published 1976Open the Tome
Planar test structures for characterizing impurities in siliconMartin G. Buehler · First published 1976Open the Tome
