Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIIIMichael Postek · First published 2014Open the Tome
Scanning Microscopies 2014Michael Postek, Dale Newbury, S. Frank Platek, Tim Maugel · First published 2014Open the Tome
Scanning Microscopies 2013Michael Postek, Dale Newbury, S. Frank Platek, Tim Maugel · First published 2013Open the Tome
Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors VMichael T. Postek, Victoria Anne Coleman · First published 2011Open the Tome
New research in nanotechnologyMichael T. Postek, Joseph Kopanski, David Wollman · First published 2011Open the Tome
Instrumentation, metrology, and standards for nanomanufacturing IVMichael T. Postek · First published 2010Open the Tome
Instrumentation, metrology, and standards for nanomanufacturing IIIMichael T. Postek · First published 2009Open the Tome
Instrumentation, metrology, and standards for nanomanufacturing IIMichael T. Postek · First published 2008Open the Tome
Nanostructure science, metrology, and technologyMichael T. Postek · First published 2002Open the Tome
Microlithography and metrology in micromachining IIMichael T. Postek · First published 1996Open the Tome
Microlithography and metrology in micromachiningMichael T. Postek · First published 1995Open the Tome
Critical Issues in Scanning Electron Microscope MetrologyMichael T. Postek · First published 1994Open the Tome
Integrated Circuit Metrology, Inspection, And Process Control VIIMichael T. Postek · First published 1993Open the Tome
Integrated Circuit Metrology, Inspection, and Process Control VIMichael T. Postek · First published 1992Open the Tome
