Applications and Metrology at Nanometer Scale 1Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami · First published 2021Open the Tome
Applications and Metrology at Nanometer-Scale 2Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami · First published 2021Open the Tome
Embedded Mechatronic SystemsAbdelkhalak El Hami, Philippe Pougnet · First published 2015 · Latest edition 2020Open the Tome
Embedded Mechatronic Systems 2Abdelkhalak El Hami, Philippe Pougnet · First published 2020Open the Tome
Nanometer-Scale Defect Detection Using Polarized LightPierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami · First published 2016Open the Tome
Systèmes Mécatroniques EmbarquésAbdelkhalak El Hami, Philippe Pougnet · First published 2015Open the Tome
